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Researcher Information

last modified:2017/05/23

Professor ARAI Toyoko

Mail Laboratory Website

Faculty, Affiliation

Faculty of Mathematics and Physics, Institute of Science and Engineering

College and School Educational Field

Division of Mathematical and Physical Science, Graduate School of Natural Science and Technology
Division of Mathematical and Physical Sciences, Graduate School of Natural Science and Technology
School of Mathematics and Physics, College of Science and Engineering

Laboratory

nano physics TEL:076-264-5660 FAX:076-264-5739

Academic Background

【Academic background(Doctoral/Master's Degree)】
Tokyo Institute of Technology Master applied physics 198703 Completed
Tokyo Institute of Technology Doctor biotechnology 199603 Completed
【Academic background(Bachelor's Degree)】
Tokyo Institute of Technology Department of applied physics 198503
【Degree】
Doctor of Engineering

Career

Japan Advanced Institute of Science and Technology School of Materials Science(1996/04/01-2005/08/31)
University of Tsukuba Graduate School of Pure and Applied Sci. Associate Professor(2005/09/01-2007/03/15)
Kanazawa University(2007/03/16-)

Year & Month of Birth

Academic Society

The Japan Society of Applied Physics
The Japan Society of Applied Physics
The Japan Society of Applied Physics
The Physical Society of Japan
The Electrochemical Society of Japan
The Surface Science Society of Japan

Award

○Nanoprobe Technology Award(2004)

Specialities

Thin film/Surface and interfacial physical properties、Nanomaterials chemistry

Speciality Keywords

Surface science, Scanning Probe Microscopy

Research Themes

Force spectroscopy based on non-contact atomic force microscopy in UHV

Development of scanning interaction spectro-microscope for fabrication of quantum nano-structures

Books

  •  M. Tomitori and T. Arai Micro-kinetics and dynamics of individual active sites in catalytic reactions Technology and Education Publishers 2001/08
  •  T. Arai and M. Tomitori Noncontact Atomic Force Microscopy Springer 2002

Papers

  •  Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips T. Arai, S. Gritschneder, L. Tröger and M. Reichling JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 28 6 1279 2010/06
  •  Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)7x7 surface by bias-voltage noncontact atomic force spectroscopy T. Arai and M. Tomitori PHYSICAL REVIEW B 73 7 073307 2006
  •  Adsorption State of 4,4’’-Diamino-p-terphenyl through an Amino Group Bound to Si(111)-7x7 Surface Examined by X-ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy 2. Takashi Nishimura, Atsushi Itabashi, Akira Sasahara, Hideyuki Murata, Toyoko Arai, and Masahiko Tomitori J. Phys. Chem. C 114 25 11109 2010/04
  •  A Si nano-pillar grown on a Si tip by AFM in UHV for a high-quality scanning probe T. Arai and M. Tomitori APPLIED PHYSICS LETTERS 86 7 073110 2005
  •  Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7x7 observed by scanning tunneling microscopy Z.A.Ansari,T.Arai,and M.Tomitori PHYSICAL REVIEW B 79 033302 2009/04

show all

  •  Observation of Electronic States on Si(111)-7x7 through Short-Range Attractive Force with Noncontact Atomic Force Spectroscopy T. Arai and M. Tomitori PHYSICAL REVIEW LETTERS 93 25 256101 2004
  •  Carbon tips as sensitive detectors for nanoscale surface and sub-surface charge T. Arai, S. Gritschneder, L. Tröger and M. Reichling NANOTECHNOLOGY 15 1302-1306 2004
  •  Atomic force microscope Si tip with Ge clusters with the capability of remoulding by heating Z.A. Ansari, T. Arai and M. Tomitori NANOTECHNOLOGY 18 8 084020 2007
  •  Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x7 Z.A. Ansari, M. Tomitori and T. Arai APPLIED PHYSICS LETTERS 88 171902 2006
  •  Energy spectra of electrons backscattered from sample surfaces with hetero structures using field emission scanning tunneling microscopy M. Hirade, T. Arai and M. Tomitori JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 45 3B 2278-2282 2006
  •  Hexagonal arrangement of Ge clusters self-organized on a template of half unit cells of Si(111)-7 x 7 observed by scanning tunneling microscopy Z.A. Ansari, T. Arai and M. Tomitori SURFACE SCIENCE LETTERS 574 17-22 2005
  •  Detection improvement for electron energy spectra for surface analysis using a field emission scanning tunneling microscope M. Hirade, T. Arai and M. Tomitori JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 42 7B 4837-4840 2003
  •  Interplay between nonlinearity, scan speed, damping, and electronics in frequency modulation atomic-force microscopy M. Gauthier, R. Perez, T. Arai, M. Tomitori and M. Tsukada PHYSICAL REVIEW LETTERS 89 14 146104 2002
  •  DNA molecules sticking on a vicinal Si(111) surface observed by noncontact atomic force microscopy T. Arai, M. Tomitori, M. Saito and E. Tamiya, APPLIED SURFACE SCIENCE 188 474-480 2002
  •  Germanium islands grown on a Si(111)7x7 surface observed by noncontact atomic force microscopy with simultaneous imaging on damping T. Arai and M. Tomitori APPLIED SURFACE SCIENCE 188 292-300 2002
  •  An applicability of scanning tunneling microscopy for surface electron spectroscopy M. Tomitori, M. Hirade, Y. Suganuma and T. Arai SURFACE SCIENCE 493 49-55 2001
  •  Simultaneous imaging of tunneling current and damping energy by noncontact-AFM in ultrahigh vacuum T. Arai and M. Tomitori APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 72 51-54 2001
  •  Simultaneous imaging of tunneling current variation by noncontact atomic force microscopy in ultrahigh vacuum T. Arai and M. Tomitori JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 39 6B 3753-3757 2000/06
  •  Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy T. Arai and M. Tomitori APPLIED SURFACE SCIENCE 157 207-211 2000
  •  Atomic force microscope tip sharpening and evaluation by electric field confinement using a metal grid approached to the tip T. Arai and M. Tomitori JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 18 2 648-652 2000
  •  Energy spectrum of backscattered electrons excited by a field emission STM with a build-up [111]-oriented W tip M. Tomitori, H. Terai and T. Arai, APPLIED SURFACE SCIENCE 144145 123-127 1999
  •  Interaction measurements between a tip and a sample in proximity region controlled by tunneling current in a UHV STM-AFM T. Arai and M. Tomitori APPLIED SURFACE SCIENCE 144145 501-504 1999
  •  Tip cleaning and sharpening processes for noncontact AFM in UHV M. Tomitori and T. Arai APPLIED SURFACE SCIENCE 140 432-438 1999
  •  Removal of contamination and oxide layers from UHV-AFM tips T. Arai and M. Tomitori APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 66 319-323 1998
  •  Scanning Auger electron microscopy evaluation and composition control of cantilevers for ultrahigh vacuum atomic force microscopy T. Arai and M. Tomitori JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 36 6B 3855-3859 1996/06
  •  Effects of electric potentials on surface forces in electrolyte solutions T. Arai and M. Fujihira JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 14 2 1378-1382 1996
  •  Analysis of surface forces on oxides in aqueous solutions using AFM T. Arai, D. Aoki, Y. Okabe and M. Fujihira THIN SOLID FILMS 273 322-326 1996
  •  Effect of tip shape on force-distance curves of AFM in aqueous electrolytes T. Arai and M. Fujihira JOURNAL OF ELECTROANALYTICAL CHEMISTRY 374 269-273 1994
  •  Nanomechanical Interaction between a Tip and a Sample with Changing Bias Voltage Observed by Using Scanning Probe Microscopy M.Tomitori,T.Arai 29 4 239-245 2008
  •  Atomic resolution FM-AFM imaging on solid surfaces covered with thin water layers Toyoko Arai KENBIKYO 51 2 72 2016/08
  •  Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory Norio Okabayashi, Alexander Gustafsson, Angelo Peronio, Magnus Paulsson, Toyoko Arai, Franz J. Giessibl Physical Review B 93 16 165415 2016/04/15
  •  Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy H. Ooe, D. Kirpal, D. S. Wastl, A. J. Weymouth, T. Arai, F. J. Giessibl Applued Physics Letters 109 14 141603 2016/10
  •  Evaluation and optimization of quartz resonant-frequency retuned fork force sensors with high Q factors, and the associated electric circuits, for non-contact atomic force microscopy Hiroaki Ooe, Mikihiro Fujii, Masahiko Tomitori, Toyoko Arai Review of Scientific Instruments 87 2 023702 2016/02
  •  Atomic-scale electric capacitive change detected with a charge amplifier installed in a non-contact atomic force microscope Makoto Nogami, Akira Sasahara, Toyoko Arai, Masahiko Tomitori Applied Physics Express 9 046601 2016/02/25
  •  Atom-resolved analysis of an ionic KBr(001) crystal surface covered with a thin water layer by frequency modulation atomic force microscopy 4. Toyoko Arai, Masashi Koshioka, Kouhei Abe, Masahiko Tomitori, Ryohei Kokawa, Masahiro Ohta, Hirofumi Yamada, Kei Kobayashi, Noriaki Oyabu Langmuir 31 13 3876-3883 2015/03
  •  Thermal transformation of 4,4″-diamino- p -terphenyl on a Si(111)-7 × 7 surface analyzed by X-ray photoemission spectroscopy and scanning tunneling microscopy Nishimura, Takashi; Sasahara, Akira; Murata, Hideyuki; Arai, Toyoko; Tomitori, Masahiko Journal of Physical Chemistry C 118 43 25104-25109 2014/10/06 
  •  Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy Hiroaki Ooe, Tatsuya Sakuishi, Makoto Nogami, Masahiko Tomitori, Toyoko Arai Applued Physics Letters 105 4 043107 2014/07

Conference Presentations

  • Mechanism of dissipation detected with non-contact atomic force microscopy on Si(111)-(7×7)(2017/03/17)
  • Analysis of mechanical properties of Au nanocontacts by frequency modulation atomic force microscopy(2017/03/17)
  • Investigate of energy dissipation detected with non-contact atomic force microcopy(2017/03/14)
  • Sensitivity depending on characteristics of quartz tuning fork for NC-AFM force sensor(2017/03/14)
  • Imaging on mica surface with ultra thin water layer by FM-AFM in air(2017/03/14)

show all

  • Vibrational spectroscopy of single CO molecule under the force field produced by a metallic tip(2016/09/13)
  • Mechanism of energy dissipation detected in non-contact atomic force microscopy(2016/09/13)
  • Mechanical properties of gold nanocontacts measured by frequency-modulation AFM combined with TEM(2016/09/13)
  • Simultaneous measurements of electric conductance and mechanical properties of Au nanocontacts(2016/09/13)
  • Atom-resolved analysis of mica surfaces covered with a thin water layer in air by frequency modulation atomic force microscopy(conference:The 19th International Conference on Non-contact Atomic Force Microscopy)(2016/07/25)
  • Effect of amplitudes on bimodal FM-AFM in ambient condition(conference:The 19th International Conference on Non-contact Atomic Force Microscopy)(2016/07/25)
  • Influence of the atomic-scale tip apex on the IETS vibrational spectroscopy of single molecules(conference:The 19th International Conference on Non-contact Atomic Force Microscopy)(2016/07/25)
  • Electronic conductance and mechanical properties of Au nanocontacts with FM-AFM(2016/06/14)
  • Atom-resolved imaging on solid surfaces with ultra thin water layer by FM-AFM in air(2016/06/14)
  • Tip-sample distance dependence of the output of a charge amplifier in NC-AFM(conference:The 18th International Conference on Non-contact Atomic Force Microscopy)(2015/09/07)
  • Simultaneous NC-AFM imaging with current and damping energy using a retuned fork sensor with a high Q-value(conference:The 18th International Conference on Non-contact Atomic Force Microscopy)(2015/09/07)
  • Dissipation decrease in a proximity region enhanced with a hydrogen-terminated Si tip in non-contact atomic force microscopy(conference:The 18th International Conference on Non-contact Atomic Force Microscopy)(2015/09/07)
  • Nanoscale capacitive analysis of surface states using a charge amplifier based on non-contact atomic force microscopy(conference:The 17th International Conference on Non-contact Atomic Force Microscopy)(2014/08/04)
  • Atom-resolved FM-AFM imaging of a KBr(001) surface covered with water layers in air with high humidity(conference:The 17th International Conference on Non-contact Atomic Force Microscopy)(2014/08/04)
  • High Q-value and noise reduction for a retuning quartz force sensor(conference:The 17th International Conference on Non-contact Atomic Force Microscopy)(2014/08/04)
  • Atomic contrast change of NH3–reacted Si(111)-7x7 surfaces observed by non-contact atomic force microscopy(conference:The 17th International Conference on Non-contact Atomic Force Microscopy)(2014/08/04)
  • Analysis of surface electronic states using nc-AFM with a charge amplifier(conference:The 16th International Conference on Non-contact Atomic Force Microscopy)(2013/08/05)
  • Two-prong type force sensor based on a quartz tuning fork for nc-AFM(conference:The 16th International Conference on Non-contact Atomic Force Microscopy)(2013/08/05)
  • Feedback control responsible for contrast change in nc-AFM images(conference:The 16th International Conference on Non-contact Atomic Force Microscopy)(2013/08/05)
  • Decrease in electrostatic force in a tunneling region detected by nc-AFM/STM(conference:The 16th International Conference on Non-contact Atomic Force Microscopy)(2013/08/05)

Arts and Fieldwork

Patent

○“Positioning mechanism and microscope with the same”, US patent, US 7,672,048 B2(country:U.S.A)(No:4644821)

Theme to the desired joint research

Grant-in-Aid for Scientific Research

○「探針-試料間電圧印加チューニングによる結合形成過程の原子分解能・顕微分光解析」(2008-2011) 
○「超高感度電気容量測定法の開発による単分子デバイスへの展開」(2009-2010) 
○「共鳴的相互作用を利用した1分子の力学・電子物性計測」(2005-2007) 
○「表面相互作用力の特性を利用した超高真空原子間力顕微鏡による表面電子状態の解析」(2000-2001) 
○「超高真空原子間力顕微鏡のための"その場"単原子探針形成法と組成制御法の研究」(1997-1998) 
○「走査型プローブ顕微鏡による2物体接近時のトンネル障壁崩壊に伴う力と電流変化の解析」(2012-2014) 

Classes (Bachelors)

○Freshman Seminar I(2017)
○Experiments in Fundamental Physics(2017)
○Presentation and Debate (Freshman Seminar II)(2017)
○Physics Experiments 2(2017)
○Solid State Physics(2017)
○Introduction to Solid State Physics(2017)
○Physics Experiments 1(2017)
○Presentation and Debate (Freshman Seminar II)(2017)
○Introduction to Solid State Physics(2016)
○Solid State Physics(2016)
○Physics Experiments 1(2016)
○Physics Experiments 2(2016)
○Experiments in Fundamental Physics(2016)

Classes (Graduate Schools)

○Solid State Physics b(2017)
○Solid State Physics a(2017)
○International Research Internship(2017)
○Seminar B(2017)
○International Research Internship(2017)
○Research Ethics(2017)
○Research Work B(2017)
○Exercise B(2017)
○Overseas Research(2017)
○Surface Science(2017)
○Surface Science(2017)
○Surface Science(2017)
○Fostering the independence of researchers(2017)
○Surface Science(2017)
○Fostering the independence of researchers(2017)
○Solid State Physics a(2016)
○Solid State Physics b(2016)
○Solid State Physics(2016)
○Overseas Research(2016)
○International Research Internship(2016)

International Project

International Students

Lecture themes

Others (Social Activities)

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