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Researcher Information

last modified:2017/09/21

Professor FUKUMA Takeshi

Mail Laboratory Website

Faculty, Affiliation

Faculty of Electrical and Computer Engineering, Institute of Science and Engineering Nanoscale Measurement Technologies
Professor

College and School Educational Field

Division of Electrical Engineering and Computer Science, Graduate School of Natural Science and Technology
Division of Electrical Engineering and Computer Science, Graduate School of Natural Science and Technology

Laboratory

Fukuma Laboratory TEL:076-234-4847 FAX:076-234-4632

Academic Background

【Academic background(Doctoral/Master's Degree)】
Kyoto University Doctor Electronic Material Engineering 200303 Completed
【Academic background(Bachelor's Degree)】
Kyoto University Department of Electronic Science and Engineering 199903
【Degree】
Ph. D. in Engineering

Career

Japan Society for the Promotion of Science Japan Society for the Promotion of Scien Research Fellow (DC1)(2001/04/01-2003/03/31)
Japan Society for the Promotion of Science Japan Society for the Promotion of Scien Research Fellow (PD)(2003/04/01-2004/03/31)
Kyoto University Kyoto University(2004/04/01-2005/03/31)
Trinity College Dublin Physics Department Senior Scientist(2005/04/01-2007/04/30)
Kanazawa University Frontier Science Organization Associate Professor(2007/05/01-)
Kanazawa University Professor(2012/04/01-)

Year & Month of Birth

1976/05

Academic Society

The Japan Society of Applied Physics
The Biophysical Society of Japan


Award

○The Young Scientists’ Prize, The Commendation for Science and Technology(2011/04/11)
○The 4th Incentive Award for Young Researcher, Biophysical Soceity of Japan(2008/12/04)
○Takagi Award, Bio-Nanotechnology Forum, The Society of Non-traditional Technology(2008/03/04)
○Nano-probe Technology Incentive Award, Japan Society for the Promotion of Science(2005/04/19)
○Young Scientist Award for the Presentation of Excellent Paper, Japan Society of Applied Physics(2004/09/01)

Specialities

Thin film/Surface and interfacial physical properties

Speciality Keywords

Nanoscale Biology, Nanotechnology, Atomic Force Microscopy, Single molecule measurements

Research Themes

Development of high-resolution atomic force microscopy technologies for applications for biophysics

Development of high-resolution atomic force microscopy technologies for applications for biophysics Atomic- and molecular-level measurement technologies have tremendously advanced in the progress of Nanotechnology. These technologies have recently been applied to the research in Bioscience. The obtained knowledge on nanoscale biomolecules in return helps to develop novel nanoscale devices in Nanotechnology. Such interactions between Nanotechnology and Bioscience result in the formation of a research field referred to as Nanobioscience. Our group is engaged in development of liquid-environment atomic force microscopy and its applications to the investigations on biological membranes in the field of Nanobioscience.

Development of high-resolution liquid-environment atomic force microscopy techniques and their applications to nanoscience research

Books

  •  Morita, F. J. Giessibl, E. Meyer (Eds.) Noncontact Atomic Force Microscopy Volume 3 Springer 2015/05/19
  •  S. P. Jarvis, J. E. Sader, T. Fukuma Applied Scanning Probe Methods VIII - Scanning Probe Microscopy Techniques Springer 2008/01
  •  Takeshi Fukuma Fundamentals of Picoscience CRC Press 2013/09
  •  Takeshi Fukuma Nanoscale Liquid Interfaces Pan Stanford Publishing 2013/05
  •  Takeshi Fukuma Advanced Biomaterial Handbook NTS 2012/06

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  •  T. Fukuma, M. J. Higgins Atomic Force Microscopy in Liquid WILEY-VCH 2012/04
  •  T. Fukuma, S. P. Jarvis Noncontact Atomic Force Microscopy Volume 2 Springer 2009/05

Papers

  •  Visualizing Nanoscale Distribution of Local Corrosion Cells by Open-Loop electric Potential Microscopy Takeshi Fukuma SINEWS 59 2 5158 2016/09
  •  Understanding 2D atomic resolution imaging of the calcite surface in water by frequency modulation atomic force microscopy J. Tracey, K. Miyazawa, P. Spijker, K. Miyata, B. Reischl, F. F. Canova, A. L. Rohl, T. Fukuma, A. S. Foster Nanotechnology  27 41 415709  2016/09
  •  Three-dimensional measurements of hydration structures by liquid-environment high-resolution atomic force microscopy Takeshi Fukuma Bunseki 5 164 2016/05
  •  Number density distribution of solvent molecules on a substrate: a transform theory for atomic force microscopy K. Amano, Y. Liang, K. Miyazawa, K. Kobayashi, K. Hashimoto, K. Fukami, N. Nishi, T. Sakka, H. Onishie and T. Fukuma PCCP 23 18 5534 2016/03
  •  Efficiency improvement in the cantilever photothermal excitation method using a photothermal conversion layer N. Inada, H. Asakawa, T. Kobayashi. T. Fukuma Beilstein J. Nanotechnol 7 409 2016/03

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  •  A relationship between three-dimensional surface hydration structures and force distribution measured by atomic force microscopy K. Miyazawa, N. Kobayashi, M. Watkins, A. L. Shluger, K. Amano. T. Fukuma Nanoscale 8 13 7334 2016/03
  •  Visualizing Nanoscale Distribution of Corrosion Cells by Open-Loop Electric Potential Microscopy K. Honbo, S. Ogata, T. Kitagawa, T. Okamoto, N. Kobayashi, I. Sugimoto, S. Shima, A. Fukunaga, C. Takatoh and T. Fukuma ACS NANO 10 2 2575 2016/01
  •  Nanoscale corrosion behavior of polycrystalline copper fine wires in dilute NaCl solution investigated by in-situ atomic force microscopy S. Ogata, N. Kobayashi, T. Kitagawa, S. Shima, A. Fukunaga, C. Takatoh, T. Fukuma Corrosion Science  105 177 2016/01
  •  Flattened-Top Domical Water Drops Formed through Self-Organization of Hydrophobin Membranes: A Structural and Mechanistic Study Using Atomic Force Microscopy R. Yamasaki, Y. Takatsuji, H. Asakawa, T. Fukuma and T. Haruyama ACS NANO 10 1 81 2016/01
  •  Structural and Electrochemical Properties of Self-organized HFBI Membranes on Different Types of Substrates  R. Yamasaki, H. Asakawa, T. Fukuma and T. Haruyama Electrochemistry 83 11 969 2015/11
  •  Mechanism of atomic force microscopy imaging of three-dimensional hydration structures at a solid-liquid interface T. Fukuma, B. Reischl, N. Kobayashi, P. Spijker, F. F. Canova, K. Miyazawa, and A. S. Foster PHYSICAL REVIEW B 92 15 155412 2015/10
  •  Improvements in fundamental performance of liquid-environment atomic force microscopy with true atomic resolution K. Miyata, K. Miyazawa, S. M. R. Akrami, T. Fukuma The Japan Society of Applied Physics 54 8S2 08LA03 2015/07
  •  Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid K Miyazawa, H Izumi, T Watanabe-Nakayama, H Asakawa, T Fukuma Nanotechnology 26 10 105707 2015/02
  •  High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid S M R Akrami, K. Miyata, H. Asakawa, T. Fukuma Rev. Sci. Instrum. 85 12 126106 2014/12
  •  Electrochemical properties of honeycomb-like structured HFBIself-organized membranes on HOPG electrodes R. Yamasaki, Y. Takatsuji, M.Lienemann, H. Asakawa, T. Fukuma, M. Linderd, T. Haruyama Colloids and Surfaces B 123 803–808 2014/12
  •  High-speed atomic-resolution imaging in liquid by atomic force microscopy Takeshi Fukuma Denki Gakkai Shi 134 12 820-823 2014/11
  •  Molecular-scale surface structures of oligo(ethylene glycol)-terminated self-assembled monolayers investigated by frequency modulation atomic force microscopy in aqueous solution N. Inada, H. Asakawa, Y. Matsumoto, T. Fukuma Nanotechnology 25 30 305602 2014/07
  •  Atomic force microscopy visualization of hard segment alignment in stretched polyurethane nanofibers prepared by electrospinning H. Sakamoto, H. Asakawa, T. Fukuma, S. Fujita, S. Suya Sci. Technol. Adv. Mater. 15 1 015008 2014/02
  •  Significant improvements in stability and reproducibility of atomic-scale atomic force microscopy in liquid S M R Akrami, H. Nakayachi, T Watanabe-nakayama, H. Asakawa, T. Fukuma Nanotechnology 25 45 455701 2014/01
  •  The relationship between local liquid density and force applied on a tip of atomic force microscope: A theoretical analysis for simple liquids K. Amano, K. Suzuki, T. Fukuma, O. Takatashi, H. Onishi JOURNAL OF CHEMICAL PHYSICS 139 22 203104 2013/12
  •  Real-time atomic-resolution imaging of crystal growth process in water by phase modulation atomic force microscopy at one frame per second K. Miyata, H. Asakawa, T. Fukuma APPLIED PHYSICS LETTERS 103 20 203104 2013/11
  •  Various measurement methods for fission tracking age-determination Gougai Chikyuu 62 124-128 2013/12
  •  Atomic-Scale Processes at the Fluorite−Water Interface Visualized by Frequency Modulation Atomic Force  N. Kobayashi, S. Itakura , H. Asakawa, T. Fukuma JOURNAL OF PHYSICAL CHEMISTRY C 117 46 24388-24396 2013/10
  •  Closed Fluid Cell with Liquid-Sealing Mechanism for Stable and Flexible Operation of Liquid-Environment Atomic Force Microscopy H. Asakawa, Y. Katagiri, T. Fukuma JAPANESE JOURNAL OF APPLIED PHYSICS 52 11R 110109 2013/10
  •  Three-dimensional measurements of structures of solid-liquid interfaces by frequency modulation atomic force microscopy Takeshi Fukuma Hyoumen Kagaku 34 9 476-481 2013/09
  •  Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy K. Miyata, S. Usho, S. Yamada, S. Furuya, K. Yoshida, H. Asakawa, T. Fukuma  REVIEW OF SCIENTIFIC INSTRUMENTS 84 4 043705 2013/04
  •  Three-dimensional quantitative force maps in liquid with 10 piconewton, angstrom and sub-minute resolutions E. T. Herruzo, H. Asakawa, T. Fukuma, R. Garcia Nanoscale 5 7 2678-2685 2013/04
  •  Spatial Distribution of Lipid Headgroups and Water Molecules at membrane/Water Interfaces Visualized by Three-Dimensional Scanning Force Microscopy H. Asakawa, S. Yoshioka, K. Nishimura, T. Fukuma ACS NANO 6 9013-9020 2012/09
  •  Dual frequency open-loop electric potential microscopy for local potential measurements in electrolyte solution with high ionic strength N. Kobayashi, H. Asakawa, T. Fukuma REVIEW OF SCIENTIFIC INSTRUMENTS 83 033709 2012/03
  •  Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies T. Fukuma, K. Onishi, N. Kobayashi, A. Matsuki, H. Asakawa NANOTECHNOLOGY 23 135706 2012/03
  •  Submolecular-Scale Imaging of α-Helices and C-Terminal Domains of Tubulins by Frequency Modulation Atomic Force Microscopy in Liquid H. Asakawa, K. Ikegami, M. Setou, N. Watanabe, M. Tsukada, T. Fukuma BIOPHYSICAL JOURNAL 101 1270-1276 2011/09
  •  Quantitative potential measurements of nanoparticles with different surface charges in liquid by open-loop electric potential microscopy N. Kobayashi, H. Asakawa,T. Fukuma JOURNAL OF APPLIED PHYSICS 110 044315 2011/08
  •  Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy T. Fukuma, S. Yoshioka, H. Asakawa REVIEW OF SCIENTIFIC INSTRUMENTS 82 073707 2011/07
  •  Ordered nano-structure of a stamped self-organized protein layer on a HOPG surface using a HFB carrier A. Iwanaga, H. Asakawa, T. Fukuma, M. Nakamichi, S. Shigematsu, M. B. Linder, T. Haruyama COLLOIDS AND SURFACES B-BIOINTERFACES 84 395-399 2011/02
  •  Nanoscale potential measurements in liquid by frequency modulation atomic force microscopy N. Kobayashi, H. Asakawa, T. Fukuma REVIEW OF SCIENTIFIC INSTRUMENTS 81 123705 2010/12
  •  Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever N. Satoh, T. Fukuma, K. Kobayashi, S. Watanabe, T. Fujii, K. Matsushige and H. Yamada APPLIED PHYSICS LETTERS 96 233104 2010/07
  •  Water distribution at solid/liquid interfaces visualized by frequency modulation atomic force microscopy T. Fukuma Science and Technology of Advanced Materials 11 033003 2010/09
  •  Submolecular-scale Investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy T. Ichii, T. Fukuma, T. Yoda, K. Kobayashi, K. Matsushige and H. Yamada JOURNAL OF APPLIED PHYSICS 107 024315 2010/01
  •  Atomic-Scale Distribution of Water Molecules at the Mica-Water Interface Visualized by Three-Dimensional Scanning Force Microscopy T. Fukuma, Y. Ueda, S. Yoshioka, H. Asakawa PHYSICAL REVIEW LETTERS 104 016101 2010/01
  •  Spurious-free cantilever excitation in liquid by piezoactuator with flexure drive mechanism H.Asakawa and T. Fukuma REVIEW OF SCIENTIFIC INSTRUMENTS 80 103703-103706 2009/10
  •  Molecular Resolution Imaging of Protein Molecules in Liquid Using Frequency Modulation Atomic Force Microscopy H. Yamada, K. Kobayashi, T. Fukuma, Y. Hirata, T. Kajita and K. Matsushige Applied Physics Express 2 095007 2009/09
  •  Wideband digital frequency detector with subtraction-based phase comparator for frequency modulation atomic force microscopy Y. Mitani, M. Kubo, K. Muramoto and T. Fukuma REVIEW OF SCIENTIFIC INSTRUMENTS 80 083705 2009/08
  •  Subnanometer-Resolution Frequency Modulation Atomic Force Microscopy in Liquid for Biological Applications T. Fukuma JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 48 08JA01 2009/08
  •  The molecular-scale arrangement and mechanical strength of phospholipid/cholesterol mixed bilayers investigated by frequency modulation atomic force microscopy in liquid H. Asakawa, T. Fukuma NANOTECHNOLOGY 20 264008 2009/06
  •  Wideband low-noise optical beam deflection sensor with photothermal excitation for liquid-environment atomic force microscopy T. Fukuma REVIEW OF SCIENTIFIC INSTRUMENTS 80 023707 2009/02
  •  Instrumentation and Biological Applications of High-Resolution Frequency Modulation Atomic Force Microscopy in Liquid T. Fukuma Journal of Nano Research 4 1-10 2008/12
  •  High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes T. Ando, T. Uchihashi, T. Fukuma 83 337 2008/09
  •  Revealing molecular-level surface structure of amyloid fibrils in liquid by means of frequency modulation atomic force microscopy T. Fukuma, A. S. Mostaert, et al. NANOTECHNOLOGY 19 384010 2008/08
  •  High resonance frequency force microscope scanner using inertia balance support T. Fukuma, Y. Okazaki et al. APPLIED PHYSICS LETTERS 92  243119-243122 2008/06
  •  Direct Imaging of Individual Intrinsic Hydration Layers on Lipid Bilayers at Angstrom Resolution T. Fukuma, M. J. Higgins, S. P. Jarvis BIOPHYSICAL JOURNAL 92 3603-3609 2007/05
  •  Direct imaging of lipid-ion network formation under physiological conditions by frequency modulation atomic force microscopy T. Fukuma, M. J. Higgins, S. P. Jarvis  PHYSICAL REVIEW LETTERS 98 106101 2007/03
  •  Phase modulation atomic force microscope with true atomic resolution T. Fukuma, J. Kilpatrick, S. P. Jarvis REVIEW OF SCIENTIFIC INSTRUMENTS 77 123703 2006/12
  •  Nanoscale Mechanical Characterization of Amyloid Fibrils Discovered in a Natural Adhesive A. S. Mostaert, M. J. Higgins, T. Fukuma, F. Rindi, S. P. Jarvis JOURNAL OF BIOLOGICAL PHYSICS 32 393-401 2006/10
  •  Structured Water Layers Adjacent to Biological Membranes M. J. Higgins, M. Polcik, T. Fukuma, J. E. Sader, Y. Nakayama and S. P. Jarvis BIOPHYSICAL JOURNAL 91 2532-2542 2006/10
  •  AFM in Liquid - A High Sensitivity Study on Biological Membranes M. J. Higgins, T. Fukuma, S. P. Jarvis G.I.T. Imaging and Microscopy 3/2006 2-4 2006/08
  •  Explanation for the mechanical strength of amyloid fibrils T. Fukuma, A. S. Mostaert and S. P. Jarvis TRIBOLOGY LETTERS 22 233-237 2006/07
  •  Development of Liquid Environment Frequency Modulation Atomic Force Microscope with Low Noise Deflection Sensor for Cantilevers of Various Dimensions T. Fukuma and S. P. Jarvis REVIEW OF SCIENTIFIC INSTRUMENTS 77 043701 2005/12
  •  Frequency-Modulation Atomic Force Microscopy at High Cantilever Resonance Frequencies using the Heterodyne Optical Beam Deflection Method T. Fukuma, K. Kimura, K. Kobayashi, K. Matsushige and H. Yamada REVIEW OF SCIENTIFIC INSTRUMENTS 76 126110 2005/12
  •  Conservative and Dissipative Force Imaging of Rotaxanes with Frequency-Modulation Atomic Force Microscopy A. A. Farrell, T. Fukuma, T. Uchihashi, E. R. Kay, G. Bottari, D. A. Leigh, H. Yamada and S. P. Jarvis PHYSICAL REVIEW B 72 125430 2005/09
  •  Self-Assembled Monolayers of Alkanethiol and Fluoroalkanethiol Investigated by Noncontact Atomic Force Microscopy T. Ichii, M. Urabe, T. Fukuma, K. Kobayashi, K. Matsushige and H. Yamada JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 44 5378-5381 2005/07
  •  True Atomic Resolution in Liquid by Frequency-Modulation Atomic Force Microscopy T. Fukuma, K. Kobayashi, K. Matsushige and H. Yamada APPLIED PHYSICS LETTERS 87 034101 2005/07
  •  True Molecular Resolution in Liquid by Frequency-Modulation Atomic Force Microscopy T. Fukuma, K. Kobayashi, K. Matsushige and H. Yamada APPLIED PHYSICS LETTERS 86 193108 2005/05
  •  Development of Low Noise Cantilever Deflection Sensor for Multienvironment Frequency-Modulation Atomic Force Microscopy T. Fukuma, M. Kimura, K. Kobayashi, K. Matsushige and H. Yamada REVIEW OF SCIENTIFIC INSTRUMENTS 76 053704 2005/04
  •  Molecular-Scale Investigations of Semi-Insulating Polymer Single Crystals by Noncontact Atomic Force Microscopy T. Ichii, H. Kawabata, T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige NANOTECHNOLOGY 16 S22-S26 2005/01
  •  True-Molecular Resolution Imaging by Frequency Modulation Atomic Force Microscopy in Various Environments T. Fukuma, T. Ichii, K. Kobayashi, H. Yamada and K. Matsushige APPLIED PHYSICS LETTERS 86 034103 2005/01
  •  Dynamic Force Microscopy at High Cantilever Resonance Frequencies using Heterodyne Optical Beam Deflection Method T. Fukuma, K. Kimura, K. Kobayashi, H. Yamada and K. Matsushige APPLIED PHYSICS LETTERS 85 6287-6289 2004/12
  •  Surface Potential Measurements by the Dissipative Force Modulation Method T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige REVIEW OF SCIENTIFIC INSTRUMENTS 75 4589-4594 2004/10
  •  Noncontact Atomic Force Microscopy Investigation of Phase-Separated Alkanethiol Self-Assembled Monolayers with Different Head Groups T. Ichii, T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 43 4545-4548 2004/07
  •  Submolecular-scale studies on metal-phthalocyanines by noncontact atomic force microscopy T. Yoda, T. Ichii, T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 43 4691-4694 2004/07
  •  Noncontact Atomic Force Microscopy Study of Copper-Phthalocyanines: Submolecular-Scale Contrasts in Topography and Energy Dissipation T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 95 4742-4746 2004/05
  •  Molecular-scale noncontact atomic force microscopy contrasts on topography and energy dissipation on c(4x2) superlattice structures of alkanethiol monolayers T. Fukuma, T. Ichii, K. Kobayashi, H. Yamada and K. Matsushige JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 95 1222-1226 2004/02
  •  Surface potential measurements of phase-separated alkanethiol monolayers by non-contact atomic force microscopy T. Ichii, T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige NANOTECHNOLOGY 15 S30-S33 2004/01
  •  Phase-Separated Alkanethiol Self-Assembled Monolayers Investigated by Non-contact AFM T. Ichii, T. Fukuma, K. Kobayashi, H. Yamada and K. Matsushige APPLIED SURFACE SCIENCE 210 99-104 2003/02
  •  Molecular-Scale Non-contact AFM Studies of Ferroelectric Organic Thin Films Epitaxially Grown on Alkali Halides T. Fukuma, K. Kobayashi, K. Noda, K. Ishida, T. Horiuchi, H. Yamada and K. Matsushige SURFACE SCIENCE 516 103-108 2002/09
  •  Local Structures and Electrical Properties of Organic Molecular Films Investigated by Non-contact Atomic Force Microscopy H. Yamada, T. Fukuma, K. Umeda, K. Kobayashi and K. Matsushige APPLIED SURFACE SCIENCE 188 391-398 2002/03
  •  Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact Atomic Force Microscopy Imaging of Molecular Thin Films T. Fukuma, K. Umeda, K. Kobayashi, H. Yamada and K. Matsushige JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 41 4903-4907 2002/03
  •  Structures and Local Electrical Properties of Ferroelectric Polymer Thin Films in Thermal Process Investigated by Dynamic Mode Atomic Force Microscopy T. Fukuma, K. Kobayashi, T. Horiuchi, H. Yamada and K. Matsushige THIN SOLID FILMS 397 133-137 2001/10
  •  Alkanethiol Self-Assembled Monolayers on Au(111) Surfaces Investigated by Non-contact AFM T. Fukuma, K. Kobayashi, T. Horiuchi, H. Yamada and K. Matsushige APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 72 S109-S112 2001/03
  •  Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy T. Fukuma, K. Kobayashi, T. Horiuchi, H. Yamada and K. Matsushige JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REV 39 3830-3833 2000/07

Conference Presentations

  • Current status and future prospects of atomic-scale liquid-environment AFM techniques(2016/09/13)
  • “Visualizing inhomogeneous adsorption structures of lubricant molecules on a magnetic hard disk by three-dimensional scanning force microscopy”(conference:19th International Conference on non-contact Atomic Force Microscopy(NC-AFM2016))(2016/07/25)
  • “Calcite Dissolution Processes Visualized by High-Speed Frequency Modulation Atomic Force Microscopy with True Atomic Resolution”(conference:The 18th International Conference on Crystal Growth and Epitaxy)(2016/08/07)
  • “Recent Advancement and Future Prospects in FM-AFM Instrumentation for Liquid-Environment Applications”(conference:Japan-Finland Research Exchange Meeting:Experiments and Theory of Liquid-Environment Scanning Probe Microscopy)(2016/04/28)
  • “Recent Developments in Liquid-Environment frequency modulation AFM”(conference:Symposiun Solid-Liquid Interfaces)(2016/04/01)

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  • "Measuring electric potential in liquids"(conference:Joint ACRITAS & MAINZ Summer School, Investigating the Solid-Liquid Interface)(2015/09/14)
  • “Visualizing nanoscale distribution of local cells in metal corrosion processes by open-loop electric potential microscopy Imaging”(conference:18th International Conference on non-contact Atomic Force Microscopy (NC-AFM2015))(2015/09/07)
  • "Visualizing atomic-scale calcite dissolution processes by high-speed frequency modulation atomic force microscopy"(conference:Atomic structure of nanosystems from first-principles simulations and microscopy experiments (AS-SIMEX 2015))(2015/07/09)
  • "Introduction to Atomic Force Microscopy"(conference:Tutorial on Microscopy Techniques)(2015/07/08)
  • “Subnanometer-scale Measurements at Solid/Liquid Interfaces by Frequency Modulation Atomic Force Microscopy”(conference:第120回日本解剖学会総会・全国学術集会/第92回日本生理学会大会 合同大会)(2015/03/21)
  • Imaging Mechanism of 3D Hydration Structures by FM-AFM Investigated by Atomic-scale AFM Simulations and Experiments(conference:17th International Conference on non-contact Atomic Force Microscopy(NC-AFM2014))(2014/08/03)
  • Instrumentation and applications of liquid-environment FM-AFM(conference:XXI International Summer School“Nicolas Cabrera”)(2014/07/14)
  • Improving Fundamental Performance of Liquid-Environment FM-AFM(conference:2013 MRS Fall Meeting & Exhibit)(2013/12/01)
  • Tip treatment for stable and reproducible atomic-scale FM-AFM in liquid(conference:16th International Conference on non-contact Atomic Force Microscopy(nc-AFM2013))
  • Atomic-scale Imaging of Solid/liquid Interfaces(conference:7th Japanese-French Frontiers of Science Symposium)(2013/01/18)
  • High-resolution Imaging of Mobile Water and Fluctuating Surface Structures at Nanobio Interfaces by 3D Scanning Force Microscopy(conference:3rd Kanazawa Bio-AFM Workshop)(2012/12/08)
  • Atomic-resolution imaging in liquid by FM-AFM using small cantilevers with megahertz-order resonance frequencies(conference:MRS fall meeting 2012)(2012/11/27)
  • Visualizing subnanometer-scale distribution of water at solid/liquid interfaces by three-dimensional scanning force microscopy(conference:First International Symposium on Advanced Water Science and Technology(ISAWST-1))(2012/11/08)
  • SUBNANOMETER-SCALE IMAGING OF NANOBIO INTERFACES BY FM-AFM(conference:XXI INTERNATIONAL MATERIALS RESEARCH CONGRESS(IMRC-2012))(2012/08/13)
  • Improvement of FM-AFM Performance in Liquid using Small Cantilevers with Megahertz-order Resonance Frequency(conference:15th International Conference on non-contact Atomic Force Microscopy(nc-AFM2012))
  • Atomic-scale studies on hydration structures at solid/liquid interfaces by FM-AFM(conference:Fundamental Aspects of Friction and Lubrication)(2012/05/10)
  • Subnanometer-Resolution Liquid-Environment AFM for Investigations on Biological Interfaces(conference:The First International Conference on Materials, Energy and Environments(ICMEE 2012))(2012/05/10)
  • Visualizing Nanobio‐interfaces by Frequency Modulation Atomic Force Microscopy(conference:2011 Korea Japan Symposium on Molecular Science)(2011/07/08)
  • Subnanometer-scale Imaging of Interfacial Water by Frequency Modulation Atomic Force Microscopy(conference:Miniworkshop on Aqueous Interfaces in Physics, Chemistry and Biology)(2010/11/27)
  • Subnanometer-scale Visualization of Nanobio-interfaces by Frequency Modulation Atomic Force Microscopy(conference:BIT's 1st Annual Congress of Nanomedicine 2010)(2010/10/25)
  • Subnanometer-resolution FM-AFM Imaging of Biological Systems in Liquid(conference:167 Committee Satellite Workshop on SPM)(2010/08/04)
  • Surface Potential Measurements by Frequency Modulation Atomic Force Microscopy in Aqueous Solution(conference:13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010))
  • Three-dimensional Distribution of Water Molecules Visualized by 3D Scanning Force Microscopy with Atomic-Scale Resolution(conference:Hydrogen and Water in Condensed Matter Physics, ISSP-11, International Symposium 2009 (ISSP11))
  • 3D Scanning Force Microscopy at Solid/Liquid Interface(conference:12th International Conference on Noncontact Atomic Force Microscopy and Casimir 2009 Workshop (NC-AF)
  • High Speed Frequency Modulation Atomic Force Microscopy using Wideband Digital Phase-Locked Loop Detector(conference:12th International Conference on Noncontact Atomic Force Microscopy and Casimir 2009 Workshop (NC-AF)
  • Instrumentation and Applications of Liquid-Environment Frequency Modulation Atomic Force Microscopy(conference:MRS fall meeting 2009)(2009/06/18)
  • Visualizing Lipid/Water and Lipid/Ion Interactions at the Biological Interfaces With Angstrom-Resolution by Frequency Modulation Atomic Force Microscopy(conference:Biophysical Society 53rd Annual Meeting(2009))
  • Molecular-Scale Investigations on Model Biological Membranes by Frequency Modulation Atomic Force Microscopy(conference:The XI Linz Winter Workshop 2009)(2009/02/06)
  • High-Speed Frequency Modulation Atomic Force Microscopy(conference:16th International Colloquium on Scanning Probe Microscopy (ICSPM16) )(2008/12/11)
  • High-speed Frequency Modulation Atomic Force Microscopy in Liquids(conference:11th International Conference on Non-contact Atomic Force Microscopy (NC-AFM2008))
  • Nanoscale Characterization of Protein Aggregates and Nanofibers(conference:The 6th International Symposium on Atomic Level Characterizations for NewMaterials and Devices '07)(2007/10/28)
  • Quantitative Characterizations of Frequency Modulation Atomic Force Microscopy Performance in Low-Q Environments(conference:10th International NC-AFM Conference (NC-AFM2007))(2007/09/16)
  • Angstrom-Resolution Imaging of Surface Structures of Amyloid Fibrils by Frequency Modulation Atomic Force Microscopy in Liquid(conference:10th International NC-AFM Conference (NC-AFM2007))(2007/09/16)
  • Quantitative Characterizations of Frequency Modulation Atomic Force Microscopy Performance in Low-Q Environments(conference:International Conference on Nanoscience and Technology 2007 (ICN+T2007))(2007/07/02)
  • Angstrom-Resolution Imaging of Internal Structures of Amyloid Fibrils by Frequency Modulation Atomic Force Microscopy in Liquid(conference:International Conference on Nanoscience and Technology 2007 (ICN+T2007))(2007/07/02)
  • Direct Imaging of Water/Lipid Interface by Frequency Modulation Atomic Force Microscopy at Sub-Angstrom Resolution(conference:Kanazawa Workshop on Atomic Force Microscopy)(2007/01/15)
  • Direct Visualization of Water/Lipid Interface by Frequency Modulation Atomic Force Microscopy at Sub-Angstrom Resolution(conference:Frontiers in Scanning Probe Microscopy)(2006/10/04)
  • Instrumentation and Biological Applications of Dynamic Force Microscopy(conference:Frontiers in Microscopy)(2006/07/05)
  • Molecular Resolution Imaging of Lipid Bilayers in Liquid by Frequency Modulation Atomic Force Microscopy(conference:The 9th International Conference on Non-contact Atomic Force Microscopy(2006))
  • Influence of Contamination from Cantilever Coatings on Atomic Force Microscopy Experiments in Aqueous Environments(conference:The 9th International Conference on Non-contact Atomic Force Microscopy(2006))
  • Molecular-Resolution Imaging of Lipid Bilayers under Physiological Conditions by Frequency Modulation Atomic Force Microscopy(conference:The International Conference on Nanoscience and Technology 2006)
  • Biological Applications of Atomic Force Microscopy in Liquid(conference:Microscopical Society of Ireland 29th Annual Symposium)(2005/09/07)
  • Development of Liquid-Environment Frequency-Modulation Atomic Force Microscope for Biological Applications(conference:The 8th International Conference on Non-contact Atomic Force Microscopy(2005))
  • True Atomic Resolution in Liquid by Frequency Modulation Atomic Force Microscopy(conference:The 13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniqu)
  • Dynamic Force Microscopy at High Cantilever Resonance Frequencies Using Heterodyne Optical Beam Deflection Method(conference:The 12th International Colloquium on Scanning Probe Microscopy(2004))
  • Multi-Environment Frequency Modulation Atomic Force Microscopy with True Molecular Resolution(conference:The 12th International Colloquium on Scanning Probe Microscopy(2004))
  • Development of Low Noise Cantilever Deflection Measurement System for Molecular-Scale Investigations in Various Environments(conference:The 7th International Conference on Non-contact Atomic Force Microscopy(2004))
  • Dynamic Force Microscopy at Higher Cantilever Resonance Frequencies Using Heterodyne Optical Beam Deflection Method(conference:The 7th International Conference on Non-contact Atomic Force Microscopy(2004))
  • Dynamic Force Microscopy at Higher Cantilever Resonance Frequencies Using Heterodyne Laser Beam Deflection Method(conference:The 8th International Conference on Nanometer-Scale Science and Technology(2004))
  • Variable-Temperature Measurements of Energy Dissipation in NC-AFM Imaging of Ferroelectric Polymer Thin Films(conference:The 11th International Colloquium on Scanning Probe Microscopy(2003))
  • Submolecular-Resolution NC-AFM Study on Metal-Phthalocyanines(conference:The 6th International Conference on Non-contact Atomic Force Microscopy(2003))
  • Surface Potential Measurements by Dissipative Force Modulation Method(conference:The 6th International Conference on Non-contact Atomic Force Microscopy(2003))
  • Sub-molecular Resolution Non-contact AFM Study on Metal-phthalocyanines(conference:The 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniqu)
  • Molecular-scale Dissipation Contrast in Organic Ultrathin Films Investigated by Non-contact Atomic Force Microscopy(conference:The 5th International Conference on Non-contact Atomic Force Microscopy(2002))
  • Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact AFM Imaging of Organic Thin Films(conference:The 9th International Colloquium on Scanning Probe Microscopy(2001))
  • Imaging of Ferroelectric Organic Ultrathin Films KCl(001) Surface by Non-contact Atomic Force Microscopy(conference:The 4th International Conference on Non-contact Atomic Force Microscopy(2001))
  • Molecular-scale Investigations of Ferroelectric Molecules Deposited on Alkali Halides by Non-contact AFM(conference:The 11th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniqu)
  • Nano-scale Investigations on Epitaxial Growth of Polar Molecules by Non-contact AFM(conference:The 1st International Conference on Molecular Electronics and Bioelectronics)(2001/03/05)
  • Non-contact AFM Imaging and Surface Potential Measurements of Ferroelectric Molecules Deposited on Insulators and Metals(conference:Korea-Japan Joint Forum 2000)
  • Alkanethiol Self-Assembled Monolayers on Au(111) Surface Investigated by Non-contact AFM(conference:The 3rd International Conference on Non-contact Atomic Force Microscopy(2000))
  • Nanometer-scale Characterization of Ferroelectric Polymer Thin Films by Variable Temperature Atomic Force Microscopy(conference:The 7th International Colloquium on Scanning Probe Microscopy(1999))

Arts and Fieldwork

Patent

○“Potential Measurement Device and Atomic Force Microscope”(country:U.S.A)(No:No. US 8839461 B2)
○Potential Measurement Device and Atomic Force Microscope(No:特許第5737640号)
○In-Liquid Potential Measurement Device and Atomic Force Microscope(publish date:2014/05/12)(No:特許第5594795号)
○“In-Liquid Potential Measurement Device and Atomic Force Microscope”(country:U.S.A)(No:No. US 8695108 B2)
○“Cantilever Excitation Device And Scanning Probe Microscope”(No:No. US 8505111 B2)
○“Scanning Probe Microscope”(No:No. US 8341760 B2)
○Scanning Probe Microscope(No:特許第5283089号)
○“Scanning Type Probe Microscope”(No:Korean Patent No.: 10-1590665)
○“Scanning Type Probe Microscope”(country:U.S.A)(No:No. US 8387159 B2)
○Scanning Type Probe Microscope(No:特許第5545214号)
○“Scanner Device For Scanning Probe Microscope”(country:U.S.A)(No:No. US 8217367 B2)

Theme to the desired joint research

Grant-in-Aid for Scientific Research

○「液中原子分解能原子間力顕微鏡の多機能化と生体膜研究への応用」(2007-) 
○「赤外分光法と原子間力顕微鏡の融合による液中での単一分子観察・同定技術の開発」(2009-) 
○「赤外分光法と原子間力顕微鏡の融合による液中での単一分子観察・同定技術の開発」(2009-2011) 

Classes (Bachelors)

○Student-Initiated Project(2017)
○Electrical Measurements(2017)
○Fundamental Physics 1(2017)
○Communication Systems(2016)
○Student-Initiated Project(2016)
○Fundamental Physics 1(2016)
○Electrical Measurements(2016)

Classes (Graduate Schools)

○Fundamentals of Nanoscale Measurements and Control A(2017)
○Advanced Super-resolution AFM Measurement(2017)
○Advanced Nanoscale Measurement Technology(2017)
○Advanced Nanoscale Measurement Technology(2017)
○Advanced Nanoscale Measurement Technology(2017)
○Advanced Nanoscale Measurement Technology(2017)
○Advanced Nanoscale Measurement Technology(2016)
○Advanced Super-resolution AFM Measurement(2016)
○Fundamentals of Nanoscale Measurements and Control A(2016)

International Project

International Students

Lecture themes

Others (Social Activities)

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